New Book Highlights SOI for ESD Protection

IEEE Fellow Dr. Steven H. Voldman has written another book in his electrostatic discharge (ESD) series, published by Wiley Press. As Dr. Voldman told ASN, “The new book, which has just been released, “ESD: Failure Mechanisms and Models”, addresses SOI failure mechanisms from a device, circuit and full chip integration perspective as well as including all the recent work on SOI FinFETs to 22nm. It tabulates the SOI failure mechanisms for failure analysis, circuit, and semiconductor engineers and will serve as a valuable reference text for the SOI industry.”

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