Two additions to Altatech equipment lines: 10x faster ultra-thin film deposition; Doppler nano-defect inspection captures true sizing and positioning

Two new products from semi equipment manufacturer Altatech: one for ultra-thin film deposition, and one for searching out nano-defects. Altatech is a division of Soitec, best known in the advanced substrates community for its leadership in SOI wafers. This part of the company, however, develops highly efficient, cost-effective inspection and chemical vapor deposition (CVD) technologies […]

OSRAM selects Altatech (Soitec) for LED wafer inspection and metrology

Altatech, a subsidiary of Soitec, has received an order for its Orion LedMax wafer inspection and metrology system from OSRAM Opto Semiconductors GmbH, one of the world’s leading manufacturers of opto electronic components (read press release here). OSRAM will use the tool to improve the performance, cost efficiency and yield of its LED-processing operations. The […]